A digital BIST for opamps embedded in mixed-signal circuits by analysing the transient response

Author

Font-Rosselló, J. ; Ginard, J. ; Isern, E. ; Roca, M. ; García, E.

Author_Institution

Dept. de Fisica, Univ. de les Illes Baleares, Palma de Mallorca, Spain

fYear

2002

fDate

6/24/1905 12:00:00 AM

Abstract

A new digital BIST for OAs embedded in mixed-signal circuits is proposed in this paper. During test mode, the transient response of the OA under test shall be measured in order to detect any deviation of the overshoot with respect to the fault-free circuit. The overshoot of the transient response is a very sensitive parameter and can be easily obtained by sampling at a particular time. The analog test stimuli signal can be easily generated by means of a current sink made of a single PMOS transistor. The test decision block is purely digital, with only two TDM comparators, two flip-flops and some logical circuitry just to compare fault-free and CUT two-bit signatures. Simulation results show the effectiveness of the proposed technique with low area overhead.

Keywords

built-in self test; mixed analogue-digital integrated circuits; operational amplifiers; transient response; CUT two-bit signature; PMOS transistor; TDM comparator; area overhead; current sink; digital BIST; embedded opamp; fault-free signature; flip-flop; logic circuit; mixed-signal circuit; overshoot parameter; test decision block; transient response; Built-in self-test; Circuit analysis; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Sampling methods; Signal generators; Transient analysis; Transient response;

fLanguage

English

Publisher

ieee

Conference_Titel

Devices, Circuits and Systems, 2002. Proceedings of the Fourth IEEE International Caracas Conference on

Print_ISBN

0-7803-7380-4

Type

conf

DOI

10.1109/ICCDCS.2002.1004077

Filename

1004077