• DocumentCode
    1627072
  • Title

    Post-enabled precision flip-chip assembly for variable MEMS capacitor

  • Author

    Faheem, F.F. ; Hoivik, N.D. ; Lee, Y.C. ; Gupta, K.C.

  • Author_Institution
    NSF Center for Adv. Manuf., Colorado Univ., Boulder, CO, USA
  • Volume
    3
  • fYear
    2003
  • Firstpage
    1927
  • Abstract
    A variable capacitor array with a high Q-factor and a high tuning ratio is demonstrated. A novel "post-enabled" flip-chip assembly allows precise multiple digital capacitance levels within one device. This capacitor array is realized by a hybrid integration of a MEMS device with RF circuits on an alumina substrate. The MEMS is prefabricated using a commercially available foundry process and is initially suspended using mechanical tethers on a silicon substrate, which is removed during the flip-chip assembly. The precise gap between the MEMS and the RF circuit is controlled using posts. Each post is designed by a stack of structural layers available in the commercial foundry process. We measured a Q-factor above 200 at 1 GHz, a capacitance ratio of 4.7:1, and tuning range of 171 MHz in a resonator circuit. More importantly, we achieved a digital capacitance level and negligible warpage due to the excellent gap control following the flip-chip assembly.
  • Keywords
    Q-factor; UHF integrated circuits; arrays; capacitance; capacitors; flip-chip devices; hybrid integrated circuits; micromechanical devices; tuning; 1 GHz; Al/sub 2/O/sub 3/; MEMS device; RF circuits; Si; alumina substrate; capacitance ratio; commercially available foundry process; gap control; high Q-factor; high tuning ratio; hybrid integration; mechanical tethers; multiple digital capacitance levels; post-enabled precision flip-chip assembly; resonator circuit; silicon substrate; structural layer stack; tuning range; variable MEMS capacitor; variable capacitor array; Assembly; Capacitance; Capacitors; Circuit optimization; Foundries; Microelectromechanical devices; Micromechanical devices; Q factor; Radio frequency; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2003 IEEE MTT-S International
  • Conference_Location
    Philadelphia, PA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-7695-1
  • Type

    conf

  • DOI
    10.1109/MWSYM.2003.1210535
  • Filename
    1210535