Title :
Reliability evaluation of a conceptual all-digital special protection system architecture for the future smart grid
Author :
Jiang, Kai ; Singh, Chanan
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas A&M Univ., College Station, TX, USA
Abstract :
The smart grid is emerging with the penetration of information-age technologies and the development of the special protection system (SPS) will be greatly influenced. This paper proposes a conceptual all-digital SPS architecture for the future smart grid. The focus of the paper is how to apply reliability analysis approaches to the new all-digital SPS schemes. Calculation of important reliability indices by the network reduction method and the Markov modeling method is illustrated in detail.
Keywords :
Markov processes; power system protection; power system reliability; smart power grids; Markov modeling method; SPS; conceptual all-digital special protection system architecture; network reduction method; reliability evaluation; smart grid; special protection system; Aggregates; Computer architecture; Markov processes; Merging; Phasor measurement units; Power system reliability; Reliability; All-digital special protection system (SPS); protection; reliability; reliability estimation; reliability modeling; smart grid;
Conference_Titel :
Power and Energy Society General Meeting, 2011 IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4577-1000-1
Electronic_ISBN :
1944-9925
DOI :
10.1109/PES.2011.6039445
