Title :
Semiconductor device parameter extraction based on reconfigurable ring oscillator frequency measurements
Author :
Kovacs, Ferenc ; Hosszu, Gabor
Author_Institution :
Dept. of Electron. Devices, Tech. Univ. of Budapest, Hungary
Abstract :
The authors discuss an extended parameter extraction procedure including the program PETRA (parameter extraction based on transient ring analysis) for the evaluation of measured data on the reconfigurable ring oscillator (RRO). The measurement data and their evaluation are presented. The improved model parameters delivered by this program increase the accuracy of the propagation delay-time simulation for dynamic-type CMOS logic cells. The benefits of the proposed method are due to the high measurement accuracy of the oscillation frequency of the RRO and the sophisticated computer work for iteration of the optimum set of model parameters
Keywords :
electronic engineering computing; iterative methods; semiconductor device models; PETRA; device parameter extraction; dynamic-type CMOS logic cells; frequency measurements; iteration; model parameters; optimum set; propagation delay-time simulation; reconfigurable ring oscillator; transient ring analysis; CMOS logic circuits; Computational modeling; Parameter extraction; Propagation delay; Rail to rail outputs; Reconfigurable logic; Ring oscillators; Semiconductor device modeling; Semiconductor devices; Transient analysis;
Conference_Titel :
Microelectronic Test Structures, 1991. ICMTS 1991. Proceedings of the 1991 International Conference on
Conference_Location :
Kyoto
Print_ISBN :
0-87942-588-1
DOI :
10.1109/ICMTS.1990.161745
