DocumentCode :
1627502
Title :
Top-contact organic transistors and complementary circuits fabricated using high-resolution silicon stencil masks
Author :
Ante, F. ; Letzkus, F. ; Butschke, J. ; Zschieschang, U. ; Burghartz, J.N. ; Kern, K. ; Klauk, H.
Author_Institution :
Max Planck Inst. for Solid State Res., Stuttgart, Germany
fYear :
2010
Firstpage :
175
Lastpage :
176
Abstract :
Here we report on top-contact organic TFTs and complementary circuits fabricated using stencil masks with a resolution of 1 μm. The stencil masks were manufactured on silicon-on-insulator (SOI) wafers, with the buried SiO2 serving as an etch stop during the formation and patterning of the Si membrane, which has a thickness of 20 μm [10,11]. Openings in the Si membrane were created by electron-beam lithography and dry etching from the wafer front side. Over an area of 20x20 mm2 the bulk silicon was then removed by etching from the wafer back side (using a SiOxNy masking layer), leaving the patterned membrane anchored to a robust 5-mm wide wafer frame.
Keywords :
electron beam lithography; etching; masks; organic semiconductors; silicon-on-insulator; thin film transistors; SOI wafers; Si; TFT; complementary circuits; dry etching; electron beam lithography; etch stop; high-resolution silicon stencil masks; silicon membrane patterning; silicon-on-insulator wafers; size 20 mum; size 5 mm; thin film transistors; top-contact organic transistors; Image edge detection; Lithography; Logic gates; Scanning electron microscopy; Silicon; Thin film transistors; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference (DRC), 2010
Conference_Location :
South Bend, IN
ISSN :
1548-3770
Print_ISBN :
978-1-4244-6562-0
Electronic_ISBN :
1548-3770
Type :
conf
DOI :
10.1109/DRC.2010.5551894
Filename :
5551894
Link To Document :
بازگشت