DocumentCode :
1627710
Title :
Accurate electromagnetic simulation and measurement of millimeter-wave inductors in bulk CMOS technology
Author :
Kraemer, Michael ; Dragomirescu, Daniela ; Plana, Robert
Author_Institution :
LAAS, CNRS, Toulouse, France
fYear :
2010
Firstpage :
61
Lastpage :
64
Abstract :
In radio frequency integrated circuits (RFICs) that use a low resistivity silicon substrate, spiral inductors show advantages in performance and size with respect to transmission lines, even at millimeter-waves (mm-waves). Design guidelines to create mm-wave inductors and equivalent circuit models describing them exist in literature. However, these models need to be parametrized either from test-structure measurement or electromagnetic (EM) simulations. This paper complements previous work by discussing problems that arise when trying to accurately determine the spiral´s parameters as inductance and quality factor. Firstly, it provides guidelines for obtaining accurate and consistent results using different kinds of EM simulators. Secondly, the issue of accurately measuring the fabricated inductors by de-embedding test structure parasitics is discussed. The results obtained from measurements are compared to the simulation results of an inductor test structure, confirming the validity of the considerations before.
Keywords :
CMOS integrated circuits; Q-factor; circuit simulation; electromagnetic induction; equivalent circuits; inductors; integrated circuit modelling; integrated circuit testing; millimetre wave integrated circuits; transmission lines; EM simulator; bulk CMOS technology; electromagnetic measurement; electromagnetic simulation; equivalent circuit model; inductance; inductor test structure; low resistivity silicon substrate; millimeter-wave inductor; mm-wave inductor; quality factor; radio frequency integrated circuit; spiral inductor; transmission line; CMOS technology; Circuit simulation; Electromagnetic induction; Electromagnetic measurements; Inductors; Millimeter wave integrated circuits; Millimeter wave measurements; Millimeter wave technology; Radiofrequency integrated circuits; Transmission line measurements; inductor; mm-wave; on-chip; spiral;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Silicon Monolithic Integrated Circuits in RF Systems (SiRF), 2010 Topical Meeting on
Conference_Location :
New Orleans, LA
Print_ISBN :
978-1-4244-5456-3
Type :
conf
DOI :
10.1109/SMIC.2010.5422948
Filename :
5422948
Link To Document :
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