Title :
Power semiconductor devices: design and manufacturing for improved field reliability (invited)
Author_Institution :
Electr. & Comput. Eng. Dept., Illinois Univ., Chicago, IL, USA
fDate :
6/24/1905 12:00:00 AM
Abstract :
In the information age, power electronic systems need to demonstrate, "nine 9\´s" of field reliability. The current reliability performance of most power converters is at best is in the range of "six 9\´s." A dramatic improvement in device robustness is needed to successfully address the emerging market demand. In this paper, we discuss a new "top-down" system-level approach to identify and correct excessive field failures in compact high-frequency computer and telecom power supplies. We outline approaches to design and manufacture robust power semiconductor switches that guarantee "built-in" field reliability.
Keywords :
failure analysis; power semiconductor switches; power supplies to apparatus; semiconductor device reliability; computer power supplies; device robustness; field failures; field reliability; power semiconductor devices; reliability performance; semiconductor switches; telecom power supplies; top-down system-level approach; Circuit testing; Computer aided manufacturing; Power semiconductor switches; Power supplies; Power system reliability; Robustness; Semiconductor device manufacture; Semiconductor device reliability; Stress; Telecommunication computing;
Conference_Titel :
Devices, Circuits and Systems, 2002. Proceedings of the Fourth IEEE International Caracas Conference on
Print_ISBN :
0-7803-7380-4
DOI :
10.1109/ICCDCS.2002.1004104
