Title :
RF characterization of a low cost multichip packaging technology for monolithic microwave and millimeter wave integrated circuits
Author :
Jayaraj, K. Jay ; Noll, Thomas E. ; Singh, Donald
Author_Institution :
Foster-Miller Inc., Waltham, MA, USA
Abstract :
This paper describes a unique multichip module technology based on highly impermeable liquid crystal polymers (LCPs) to interconnect and package Microwave and Millimeter Wave Monolithic Integrated Circuits (MIMICs). Because of the low moisture permeability of the LCPs, the packages can be made hermetic without heavy expensive housings, and can be two to four times lighter and one-fifth the cost of conventional ceramic based transmit/receive (T/R) modules. Preliminary results indicate that the LCP has a low dielectric constant, and low loss transmission lines can be manufactured on LCPs using large area processing techniques that provide a tremendous cost advantage over competing technologies. Using flip chip bonded MMICs attached to a high thermal conductivity, low coefficient of thermal expansion substrate, this innovative technology can meet a variety of commercial, military and space requirements
Keywords :
MIMIC; MMIC; flip-chip devices; integrated circuit interconnections; integrated circuit packaging; liquid crystal polymers; multichip modules; thermal conductivity; thermal expansion; IC interconnections; RF characterization; coefficient of thermal expansion; dielectric constant; flip chip bonded MMICs; hermetic packaging; impermeable liquid crystal polymers; large area processing techniques; low loss transmission lines; moisture permeability; monolithic microwave integrated circuits; monolithic millimeter wave integrated circuits; multichip module technology; multichip packaging technology; thermal conductivity; Costs; Integrated circuit packaging; Integrated circuit technology; MIMICs; Millimeter wave technology; Multichip modules; Radio frequency; Space technology; Thermal conductivity; Thermal expansion;
Conference_Titel :
Signals, Systems, and Electronics, 1995. ISSSE '95, Proceedings., 1995 URSI International Symposium on
Conference_Location :
San Francisco
Print_ISBN :
0-7803-2516-8
DOI :
10.1109/ISSSE.1995.498027