DocumentCode :
1628135
Title :
Multiprobe microwave multimeter error estimation a priori
Author :
Zaichenko, O.B.
Author_Institution :
Metrol. & Meas. Technol. Dept., Kharkov Nat. Univ. of Radio Electron., Ukraine
Volume :
2
fYear :
2004
Firstpage :
795
Abstract :
At a functional design stage there is a necessity of a priori estimation of general error in connection with the requirement specification. Thus such elements and structural links should be selected, that the estimation has not left for limits by given one. Pursuant to a technique of general error definition it is necessary to know or to set limiting values of individual components of errors, their distribution functions and to distinguishing from them dominant ones, to study a capability of correction. In multiprobe microwave multimeter the following series transformations is performed: analogue transformation, digitization of an analog quantity, digital processing of the digitized values under the algorithms realized by programs. The structure and contents of the model is given, which one describes transformation of error and its accumulation, at stages of measurement transformation. For the construction of the model we begin from one measurement channel observation. The metrology model of a channel is under construction on the basis of a functional diagram. It serves for the description of metrology properties, and also for an estimation of the influential factors and degree of their influencing on measurement result. Metrology model is set of mathematical descriptions of relation of an input signal of measurement device from an input signal with taking into consideration of all possible influential factors. Thus, for each measuring unit it is necessary to reveal the influential factors and to evaluate error caused by them.
Keywords :
analogue-digital conversion; error analysis; measurement errors; microwave measurement; multimeters; power measurement; ADC nonlinearity; a priori estimation; algorithmic processing; analogue transformation; digitization; error estimation; metrology properties; model construction; multiprobe microwave multimeter; requirement specification; sensor error; Analog-digital conversion; Distributed amplifiers; Electrical resistance measurement; Error analysis; Feedback loop; Frequency dependence; Measurement units; Resistors; Temperature distribution; Temperature sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Physics and Engineering of Microwaves, Millimeter, and Submillimeter Waves, 2004. MSMW 04. The Fifth International Kharkov Symposium on
Print_ISBN :
0-7803-8411-3
Type :
conf
DOI :
10.1109/MSMW.2004.1346158
Filename :
1346158
Link To Document :
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