A comparison of monolithic background calibration in two time-interleaved analog-to-digital converters

Author

Dyer, Kenneth ; Fu, Daihong ; Hurst, Paul ; Lewis, Stephen

Author_Institution

Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA

Volume

1

fYear

1998

Firstpage

13

Abstract

Two background calibration methods for time-interleaved pipelined analog-to-digital converters are described and compared. One approach uses an extra ADC channel and analog calibration circuits; the other uses extra resolution and digital calibration circuits. Both approaches have been integrated in a 1-μm CMOS process. The strengths and weaknesses of the two approaches are presented, and the measured data are compared

Keywords

CMOS integrated circuits; analogue-digital conversion; calibration; pipeline processing; 1 micron; ADC channel; CMOS process; analog calibration circuit; digital calibration circuits; measured data; monolithic background calibration; pipelined analog-to-digital converters; resolution; time-interleaved analog-to-digital converters; Analog-digital conversion; Apertures; Bandwidth; Calibration; Digital filters; Digital signal processing; Filtering; Laboratories; Signal resolution; Solid state circuits;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1998. ISCAS '98. Proceedings of the 1998 IEEE International Symposium on

Conference_Location

Monterey, CA

Print_ISBN

0-7803-4455-3

Type

conf

DOI

10.1109/ISCAS.1998.704123

Filename

704123