Title :
Distribution high impedance fault location using localized voltage magnitude measurements
Author :
Hossain, Shahadat ; Hao Zhu ; Overbye, Thomas
Author_Institution :
Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Abstract :
The detection and location of high impedance faults has historically been a difficult endeavor due to the low currents produced. However, the recent advent of distributed voltage monitoring devices, enabling access to fast-sampled, expansive voltage measurements throughout a distribution network, can ease this task. This paper considers the potential to use these distribution level devices to detect and locate such faults. A simulation-based method is proposed that compares a measured voltage profile, obtained from the devices, and simulated voltage profiles at various locations using a power system simulation software. The simulation locations are intelligently selected using the Golden section search and possible fault impedance values are iterated through for each location. The L1-norm is used to compare the two profiles, with the lowest error norm representing the best match - the most likely fault location and impedance.
Keywords :
fault location; fault simulation; power distribution faults; voltage measurement; Golden section search; L1-norm; distributed voltage monitoring devices; distribution high impedance fault location; distribution network; error norm; fault impedance values; localized voltage magnitude measurements; measured voltage profile; power system simulation software; simulated voltage profiles; simulation-based method; Current measurement; Fault location; Impedance; Impedance measurement; Monitoring; Noise; Voltage measurement; distributed monitoring devices; fault location; high impedance fault; voltage sags;
Conference_Titel :
North American Power Symposium (NAPS), 2014
Conference_Location :
Pullman, WA
DOI :
10.1109/NAPS.2014.6965403