Title :
Use of near-field microwave microscope for measurement of dielectric constant
Author :
Launets, V.L. ; Oliynyk, V.V.
Author_Institution :
Nat. Taras Shevchenko Univ. of Kyiv, Ukraine
Abstract :
In order to simplify the measurement of permittivity we have worked out a method in which as a measurement device was used the near-field microwave microscope with probe, which has the form of an open-ended coaxial waveguide; what is important is that the probe has salient inner conductor. The coaxial probe is connected with the elements of the microscope by waveguide-coaxial transition. Such a probe construction allows decreasing essentially the accuracy requirements to this experiment.
Keywords :
calibration; coaxial waveguides; microscopes; microwave measurement; permittivity measurement; probes; waveguide transitions; calibration; coaxial probe; matching points; near field interaction; near-field microwave microscope; open-ended coaxial waveguide; permittivity measurement; reflection dependence; salient inner conductor; waveguide-coaxial transition; Coaxial components; Conductors; Dielectric constant; Dielectric measurements; Microscopy; Microwave devices; Microwave measurements; Microwave theory and techniques; Permittivity measurement; Probes;
Conference_Titel :
Physics and Engineering of Microwaves, Millimeter, and Submillimeter Waves, 2004. MSMW 04. The Fifth International Kharkov Symposium on
Print_ISBN :
0-7803-8411-3
DOI :
10.1109/MSMW.2004.1346177
