• DocumentCode
    1629335
  • Title

    Face recognition from video: a CONDENSATION approach

  • Author

    Zhou, Shaohua ; Krueger, Volker ; Chellappa, Rama

  • Author_Institution
    Center for Autom. Res., Maryland Univ., College Park, MD, USA
  • fYear
    2002
  • Firstpage
    221
  • Lastpage
    226
  • Abstract
    The aim of this work is to investigate how to exploit the temporal information in a video sequence for the task of face recognition. Following the approach in (Li and Chellappa, 2000), we propose a probabilistic model parameterized by a tracking state vector and a recognizing identity variable, simultaneously characterizing the kinematics and identity of humans. We then invoke a CONDENSATION (Isard and Blake, 1996) approach to provide a numerical solution to the model. Once the joint posterior distribution of the state vector and the identity variable is estimated, we marginalize it over the state vector to yield a robust estimate of the posterior distribution of the identity variable. Due to the propagation of identity and dynamics, a degeneracy in the posterior distribution of the identity variable is achieved to give improved recognition. This evolving behavior is characterized using changes in entropy. The effectiveness of this approach is illustrated using experimental results on low-resolution video data.
  • Keywords
    face recognition; image resolution; image sequences; importance sampling; probability; CONDENSATION approach; Sequential Importance Sampling algorithm; experimental results; face recognition; joint posterior distribution; kinematics; low-resolution video data; probabilistic model; state vector; temporal information; tracking state vector; video sequence; Face detection; Face recognition; Humans; Kinematics; Linear discriminant analysis; Principal component analysis; Probes; State estimation; Video sequences; Yield estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Automatic Face and Gesture Recognition, 2002. Proceedings. Fifth IEEE International Conference on
  • Conference_Location
    Washington, DC, USA
  • Print_ISBN
    0-7695-1602-5
  • Type

    conf

  • DOI
    10.1109/AFGR.2002.1004158
  • Filename
    1004158