DocumentCode
1629980
Title
Test Technology Technical Council (TTTC)
fYear
2006
Abstract
Provides a listing of current committee members and society officers.
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2006. Proceedings. 24th IEEE
Conference_Location
Berkeley, CA
Print_ISBN
0-7695-2514-8
Type
conf
DOI
10.1109/VTS.2006.86
Filename
1617551
Link To Document