Title :
The Excess Carrier Lifetime in P-Type HgCdTe Measured by Photoconductive Decay
Author :
Fastow, R. ; Nemirovsky, Y.
Author_Institution :
Dept. of Electrical Engineering, Technion-Israel Institute or Technology
Keywords :
Charge carrier lifetime; Crystalline materials; Electric variables measurement; Infrared detectors; Mercury (metals); Particle measurements; Photoconducting devices; Photoconducting materials; Photoconductivity; Temperature dependence;
Conference_Titel :
Electrical and Electronics Engineers in Israel, 1989. The Sixteenth Conference of
DOI :
10.1109/EEIS.1989.720012
