Title :
Aitest: A Real Life Expert System for Electronic Troublshooting and Test Management
Author :
Ben-Bassat, Moshe ; Ben-Arie, Daphna ; Ben-Zvi, Inna ; Binyamini, Israel ; Cheifetz, Jonathan ; Sela, Mordechai ; Shalev, Michal
Author_Institution :
Tel Aviv University, Israel
Keywords :
Costs; Design engineering; Electronic equipment testing; Engineering management; Expert systems; Fault diagnosis; Large-scale systems; Libraries; Life testing; System testing;
Conference_Titel :
Electrical and Electronics Engineers in Israel, 1989. The Sixteenth Conference of
DOI :
10.1109/EEIS.1989.720018
