DocumentCode :
1630594
Title :
Thin film shear modulus determination with quartz crystal resonators: a review
Author :
Lucklum, Ralf ; Hauptmann, Peter
Author_Institution :
Otto-von-Guericke-University, Magdeburg, Germany
fYear :
2001
fDate :
6/23/1905 12:00:00 AM
Firstpage :
408
Lastpage :
418
Abstract :
An important application of quartz crystal resonators is the quartz crystal microbalance (QCM). It is well established as thickness monitor in vacuum deposition units or as chemical sensor, e.g., in an electronic nose or electronic tongue. As QCM the high sensitivity of the mechanical eigenfrequency to surface mass changes is exploited. QCMs obtain their chemical sensitivity and selectivity from a chemically active coating, which interacts with the surrounding environment. Analyte sorption in the sensitive layer results in a change of the surface mass and hence in the resonator´s frequency. A new fascinating application is the determination of material properties of thin viscoelastic films. The recently developed methods will be reviewed
Keywords :
crystal resonators; elastic moduli measurement; electric sensing devices; polymer films; shear modulus; thickness measurement; viscoelasticity; QCM; SiO2; calibration; chemical sensitivity; quartz crystal microbalance; quartz crystal resonators; selectivity; shear loss modulus; shear storage; thickness monitor; thin polymer films; vacuum deposition; Chemical sensors; Coatings; Elasticity; Electronic noses; Material properties; Monitoring; Resonant frequency; Tongue; Transistors; Viscosity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium and PDA Exhibition, 2001. Proceedings of the 2001 IEEE International
Conference_Location :
Seattle, WA
ISSN :
1075-6787
Print_ISBN :
0-7803-7028-7
Type :
conf
DOI :
10.1109/FREQ.2001.956262
Filename :
956262
Link To Document :
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