• DocumentCode
    1630594
  • Title

    Thin film shear modulus determination with quartz crystal resonators: a review

  • Author

    Lucklum, Ralf ; Hauptmann, Peter

  • Author_Institution
    Otto-von-Guericke-University, Magdeburg, Germany
  • fYear
    2001
  • fDate
    6/23/1905 12:00:00 AM
  • Firstpage
    408
  • Lastpage
    418
  • Abstract
    An important application of quartz crystal resonators is the quartz crystal microbalance (QCM). It is well established as thickness monitor in vacuum deposition units or as chemical sensor, e.g., in an electronic nose or electronic tongue. As QCM the high sensitivity of the mechanical eigenfrequency to surface mass changes is exploited. QCMs obtain their chemical sensitivity and selectivity from a chemically active coating, which interacts with the surrounding environment. Analyte sorption in the sensitive layer results in a change of the surface mass and hence in the resonator´s frequency. A new fascinating application is the determination of material properties of thin viscoelastic films. The recently developed methods will be reviewed
  • Keywords
    crystal resonators; elastic moduli measurement; electric sensing devices; polymer films; shear modulus; thickness measurement; viscoelasticity; QCM; SiO2; calibration; chemical sensitivity; quartz crystal microbalance; quartz crystal resonators; selectivity; shear loss modulus; shear storage; thickness monitor; thin polymer films; vacuum deposition; Chemical sensors; Coatings; Elasticity; Electronic noses; Material properties; Monitoring; Resonant frequency; Tongue; Transistors; Viscosity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium and PDA Exhibition, 2001. Proceedings of the 2001 IEEE International
  • Conference_Location
    Seattle, WA
  • ISSN
    1075-6787
  • Print_ISBN
    0-7803-7028-7
  • Type

    conf

  • DOI
    10.1109/FREQ.2001.956262
  • Filename
    956262