DocumentCode
1630670
Title
Early, accurate and fast yield estimation through Monte Carlo-alternative probabilistic behavioral analog system simulations
Author
Topaloglu, Rasit Onur
Author_Institution
Dept. of Comput. Sci. & Eng., California Univ., La Jolla, CA
fYear
2006
Lastpage
142
Abstract
Monte Carlo analysis has so far been the corner stone for analog statistical simulations. Fast and accurate simulations are necessary for stringent time-to-market, design for manufacturability and yield concerns in the analog domain. Although Monte Carlo attains accuracy, it does so with a sacrifice in run-time for analog simulations. In this paper, we propose a fast and accurate probabilistic simulation method alternative to Monte Carlo using deterministic sampling and weight propagation. We furthermore propose accuracy improvement algorithms and a fast yield calculation method. The proposed method shows accuracy improvement combined with a 100-fold reduction in run-time with respect to a 1000-sample Monte Carlo analysis
Keywords
Monte Carlo methods; analogue simulation; estimation theory; Monte Carlo analysis; accurate probabilistic simulation; accurate yield estimation; analog statistical simulations; behavioral analog system; deterministic sampling; early yield estimation; fast yield estimation; probabilistic analog system; weight propagation; Analytical models; Circuit simulation; Computational modeling; Computer simulation; Monte Carlo methods; Principal component analysis; Runtime; Sampling methods; Sensitivity analysis; Yield estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2006. Proceedings. 24th IEEE
Conference_Location
Berkeley, CA
Print_ISBN
0-7695-2514-8
Type
conf
DOI
10.1109/VTS.2006.30
Filename
1617576
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