• DocumentCode
    1630670
  • Title

    Early, accurate and fast yield estimation through Monte Carlo-alternative probabilistic behavioral analog system simulations

  • Author

    Topaloglu, Rasit Onur

  • Author_Institution
    Dept. of Comput. Sci. & Eng., California Univ., La Jolla, CA
  • fYear
    2006
  • Lastpage
    142
  • Abstract
    Monte Carlo analysis has so far been the corner stone for analog statistical simulations. Fast and accurate simulations are necessary for stringent time-to-market, design for manufacturability and yield concerns in the analog domain. Although Monte Carlo attains accuracy, it does so with a sacrifice in run-time for analog simulations. In this paper, we propose a fast and accurate probabilistic simulation method alternative to Monte Carlo using deterministic sampling and weight propagation. We furthermore propose accuracy improvement algorithms and a fast yield calculation method. The proposed method shows accuracy improvement combined with a 100-fold reduction in run-time with respect to a 1000-sample Monte Carlo analysis
  • Keywords
    Monte Carlo methods; analogue simulation; estimation theory; Monte Carlo analysis; accurate probabilistic simulation; accurate yield estimation; analog statistical simulations; behavioral analog system; deterministic sampling; early yield estimation; fast yield estimation; probabilistic analog system; weight propagation; Analytical models; Circuit simulation; Computational modeling; Computer simulation; Monte Carlo methods; Principal component analysis; Runtime; Sampling methods; Sensitivity analysis; Yield estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2006. Proceedings. 24th IEEE
  • Conference_Location
    Berkeley, CA
  • Print_ISBN
    0-7695-2514-8
  • Type

    conf

  • DOI
    10.1109/VTS.2006.30
  • Filename
    1617576