Title :
Statistical analysis of resistive switching characteristics in ReRAM test arrays
Author :
Zambelli, Cristian ; Grossi, Alessandro ; Olivo, Piero ; Walczyk, Damian ; Bertaud, T. ; Tillack, Bernd ; Schroeder, Thomas ; Stikanov, Valeriy ; Walczyk, C.
Author_Institution :
Dipt. di Ing., Univ. degli Studi di Ferrara, Ferrara, Italy
Abstract :
The design and the manufacturing of ReRAM test structures allow deeper insight in the performance of the FORMING, RESET, and SET operations at array level, providing details on the process induced variability of the technology, and on the potential sources of failures. Test structures allow also demonstrating the integration capability of the ReRAM technology using a CMOS-compatible process ramping up such non-volatile memory to a maturity level.
Keywords :
CMOS memory circuits; logic testing; random-access storage; statistical analysis; CMOS-compatible process; FORMING operations; RESET operations; ReRAM technology; ReRAM test arrays; nonvolatile memory; process induced variability; resistive switching characteristics; statistical analysis; Arrays; Microprocessors; Nonvolatile memory; Resistance; Switches; Testing; ReRAM; array; statistics; test-structure;
Conference_Titel :
Microelectronic Test Structures (ICMTS), 2014 International Conference on
Conference_Location :
Udine
Print_ISBN :
978-1-4799-2193-5
DOI :
10.1109/ICMTS.2014.6841463
