DocumentCode
1630967
Title
The Omnitest system: a no-generate, no-compile, interactive test methodology
Author
Dettloff, Wayne D. ; Tebbs, MeZbdie D.
Author_Institution
Microelectron. Center of North Carolina, Research Triangle Park, NC, USA
fYear
1989
Firstpage
572
Lastpage
576
Abstract
The authors present executable VLSI test software which reads a digital device specification file and dynamically reconfigures the tester at run time. The Omnitest concept has been demonstrated on the Megatest MegaOne VLSI tester. Complete device description files have gone from data manual to error-free-testing in under an hour. The Omnitest program completely masks the detailed operation of the MegaOne, yet allows the user to take advantage of all the tester´s sophisticated features. Engineers who have had no previous exposure to test have been able to comprehend and utilize the input language after merely reviewing an example. Besides shortening development times and enabling a high-level approach to digital test, the Omnitest system also frees tester resources, standardizes test-related operations, and provides ample means to revise and amend
Keywords
VLSI; automatic test equipment; automatic testing; digital integrated circuits; integrated circuit testing; interactive systems; ATE; IC testing; Megatest MegaOne; Omnitest; VLSI test software; digital device specification file; error-free-testing; Acceleration; Circuit testing; Digital integrated circuits; Integrated circuit technology; Microelectronics; Production; Runtime; Software testing; System testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location
Washington, DC
Type
conf
DOI
10.1109/TEST.1989.82342
Filename
82342
Link To Document