مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

1630994

Title :

Session Abstract

Author :

Hatayama, Kazumi

Author_Institution :

Renesas Technology Corp.

fYear :

2006

Firstpage :

200

Lastpage :

201

Abstract :

In this session, various case studies of leading edge SoCs testing are presented with advanced ideas for effective and efficient testing.

fLanguage :

English

Publisher :

ieee

Conference_Titel :

VLSI Test Symposium, 2006. Proceedings. 24th IEEE

Print_ISBN :

0-7695-2514-8

Type :

conf

DOI :

10.1109/VTS.2006.69

Filename :

1617589

Link To Document :