DocumentCode :
1631446
Title :
Session Abstract
Author :
Nicolaidis, Michael
Author_Institution :
TIMA Labs & iRoC Technologies
fYear :
2006
Firstpage :
286
Lastpage :
287
Abstract :
Three soft-error experts from industry will discuss the way their companies understand the impact of soft-errors on electronic systems, whether they consider soft-errors as an already existing or upcoming risk, whether they use or intent to introduce countermeasures and which are the best suited ones for their applications.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2006. Proceedings. 24th IEEE
Print_ISBN :
0-7695-2514-8
Type :
conf
DOI :
10.1109/VTS.2006.79
Filename :
1617603
Link To Document :
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