• DocumentCode
    1631503
  • Title

    Universal at-speed test fixturing for high-pin-count ICs

  • Author

    Levy, Paul S.

  • Author_Institution
    VLSI Technol. Inc., Tempe, AZ, USA
  • fYear
    1994
  • Firstpage
    482
  • Lastpage
    485
  • Abstract
    This paper details design guidelines and implementation of a universal load-board system to support high-pin-count ASIC designs. ASICs needing multiple supplies can also be supported. High-speed AC measurements are also possible without the use of expensive custom load-board systems.
  • Keywords
    application specific integrated circuits; integrated circuit measurement; integrated circuit testing; production testing; ASICs; IC testing; at-speed test fixturing; design guidelines; high-pin-count ICs; high-speed AC measurements; multiple supplies; product fixturing; test environment; universal load-board system; Application specific integrated circuits; Fixtures; Integrated circuit testing; Manufacturing; Packaging; Power distribution; Power supplies; Proposals; Relays; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Southcon/94. Conference Record
  • Conference_Location
    Orlando, FL, USA
  • Print_ISBN
    0-7803-9988-9
  • Type

    conf

  • DOI
    10.1109/SOUTHC.1994.498152
  • Filename
    498152