Title :
Mainstream ATE: to reduce LSI and VLSI test cost
Author :
Salter, Michael W. ; Taschioglou, Kemon
Author_Institution :
STS, Burlington, MA, USA
Abstract :
It is proposed that test costs for LSI and VLSI mainstream devices be reduced by matching performance requirements with manufacturing strategy. The approach is to complement ATE (automatic test equipment) for testing leading-edge devices by ATE with the appropriate requirements for testing families of mainstream devices
Keywords :
VLSI; automatic test equipment; automatic testing; economics; integrated circuit testing; large scale integration; production testing; ATE; LSI; VLSI; leading-edge devices; mainstream devices; test cost; Costs; Economies of scale; Large scale integration; Lead compounds; Marine vehicles; Production; Semiconductor device manufacture; Sociotechnical systems; System testing; Very large scale integration;
Conference_Titel :
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location :
Washington, DC
DOI :
10.1109/TEST.1989.82345
