Title :
R96MFX test strategy
Author :
Mann, William R.
Abstract :
The author describes the design for test features and overall test strategy for the R96MFX integrated circuit. This product is a 9600-b-per second half duplex modem used in facsimile equipment. It is implemented by two separate silicon dies mounted within one 64-pin package. Each of these two circuits had been previously designed and used in separate packages, so combining them in one package resulted in an I/O (input/output) pin consolidation which seriously limited the circuits´ controllability and observability. The test strategy utilized to solve this limitation relies on the complementary test that IC manufacturers may perform; that is, they may thoroughly test a device at the wafer level and then test the device again after packaging for those failures induced by the packaging process. A self-test feature was implemented in the firmware instructions in one of the two chips thereby enabling extensive testing to be accomplished in spite of the controllability/observability limitations
Keywords :
automatic testing; electronic equipment testing; facsimile equipment; integrated circuit testing; modems; production testing; 9600 bit/s; IC; R96MFX integrated circuit; controllability/observability limitations; facsimile equipment; firmware instructions; half duplex modem; packaging; self-test; wafer level; Circuit testing; Controllability; Facsimile; Integrated circuit packaging; Integrated circuit testing; Modems; Observability; Packaging machines; Silicon; Wafer scale integration;
Conference_Titel :
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location :
Washington, DC
DOI :
10.1109/TEST.1989.82348
