Title :
Test effectiveness metrics for CMOS faults
Author :
Midkiff, Scott F. ; Koe, Wern-Yan
Author_Institution :
Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Abstract :
The authors present two novel metrics (range effectiveness and differentiation effectiveness) for evaluating the effectiveness of continuous-domain test techniques, such as supply current and propagation delay testing, for CMOS faults of general severity. The metrics consider both the severity of the fault and the differentiation of test measurements. Range effectiveness is used to determine the range of fault severities that are reliably detected as being present in a circuit, and differentiation effectiveness is used to determine the differentiation between good and faulty circuits for a specified maximum acceptable fault severity. An application comparing supply current and propagation delay testing of a bridging fault is presented to illustrate the metrics
Keywords :
CMOS integrated circuits; delays; fault location; integrated circuit testing; CMOS faults; bridging fault; continuous-domain test; differentiation effectiveness; propagation delay testing; range effectiveness; supply current; test effectiveness; CMOS logic circuits; Circuit faults; Circuit testing; Current supplies; Electrical fault detection; Fault detection; Integrated circuit testing; Logic testing; Propagation delay; Semiconductor device modeling;
Conference_Titel :
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location :
Washington, DC
DOI :
10.1109/TEST.1989.82352
