DocumentCode
1631768
Title
Risk-based composite power system vulnerability evaluation to cascading failures using importance sampling
Author
Chen, Quan ; Mili, Lamine
Author_Institution
Bradley Dept. of Electr. & Comput. Eng., Virginia Tech, Falls Church, VA, USA
fYear
2011
Firstpage
1
Lastpage
6
Abstract
Large-scale blackouts typically result from cascading failure in power systems operation. Their mitigation in power system planning calls for the development of methods and algorithms that assess the risk of cascading failures due to relay overtripping, short-circuits induced by overgrown vegetation, voltage sags, line and transformer overloading, transient instabilities, voltage collapse, to cite a few. This paper describes such a method based on composite power system reliability evaluation via sequential Monte Carlo simulation. One of the impediments of the study of these phenomena is the prohibitively large computational burden involved by the simulations. To overcome this difficulty, importance sampling technique utilizing the Weibull distribution is applied. It is shown that the method significantly reduce the number of samples that need to be investigated while maintaining the accuracy at a given level. To illustrate the developed approach, a case study is conducted and analyzed on the IEEE reliability test system.
Keywords
Monte Carlo methods; Weibull distribution; power system management; power system reliability; IEEE reliability test system; Weibull distribution; blackouts; cascading failures; power system reliability evaluation; power systems operation; relay overtripping; risk based composite power system; sequential Monte Carlo simulation; short circuits; vulnerability evaluation; Conductors; Monte Carlo methods; Power system faults; Power system protection; Power system reliability; Relays; Reliability; Composite power systems; Monte Carlo methods; cascading failures; importance sampling; risk assessment;
fLanguage
English
Publisher
ieee
Conference_Titel
Power and Energy Society General Meeting, 2011 IEEE
Conference_Location
San Diego, CA
ISSN
1944-9925
Print_ISBN
978-1-4577-1000-1
Electronic_ISBN
1944-9925
Type
conf
DOI
10.1109/PES.2011.6039616
Filename
6039616
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