DocumentCode
1631794
Title
Testability expertise and test planning from high-level specifications
Author
De Paulet, M. Crastes ; Karam, M. ; Saucier, G.
Author_Institution
Inst. Nat. Polytech. de Grenoble, France
fYear
1989
Firstpage
692
Lastpage
699
Abstract
The testability expertise of boards and ASICs (application-specific integrated circuits) relies on high-level models in the Prolog language. This high-level modeling makes it possible to describe chip and board functions at an adequate level of accuracy without giving useless details. Each chip is successfully considered as a test goal; difficult chips are identified. Design modifications in terms of multiplexers or scan path insertion are proposed according to a test strategy. As a final result of this analysis, the test planning (test data flow and test control, test scheduling) is defined. The resulting test program skeleton is then formatted to lead to the final test program
Keywords
PROLOG; application specific integrated circuits; automatic testing; integrated circuit testing; logic CAD; logic testing; printed circuit testing; ASICs; IC testing; Prolog language; application-specific integrated circuits; automatic testing; design modifications; high-level models; high-level specifications; logic testing; multiplexers; scan path insertion; test control; test data flow; test planning; test scheduling; testability; Arithmetic; Artificial intelligence; Controllability; Hardware; Logic testing; Multiplexing; Observability; Read-write memory; Registers; Skeleton;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1989. Proceedings. Meeting the Tests of Time., International
Conference_Location
Washington, DC
Type
conf
DOI
10.1109/TEST.1989.82357
Filename
82357
Link To Document