• DocumentCode
    1631938
  • Title

    Rapid-melting-growth of Ge on insulator using Cobalt (Co) induced-crystallized Ge as the seed for lateral growth

  • Author

    Phung, Thanh Hoa ; Chen, Meijun ; Kang, Hong Joo ; Zhang, Chunfu ; Yu, Mingbin ; Zhu, Chunxiang

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
  • fYear
    2010
  • Firstpage
    1578
  • Lastpage
    1580
  • Abstract
    A new type of crystal seed, polycrystalline Ge (poly-Ge) formed by Co induced crystallization was used in the rapid-melting-growth (RMG) of Ge. With the poly-Ge seed, the grain size of Ge films obtained was significantly larger than the one using single crystal epitaxial Si as crystal seed and the one without any crystal seed. High quality (almost single crystal) Ge was obtained on 1 mm × 1 mm square structure and single crystal Ge was obtained on 5 μm wide Ge wires by the RMG method with Co-induced poly-Ge as the crystal seed.
  • Keywords
    cobalt; crystallisation; germanium; silicon-on-insulator; Co; Ge on insulator; crystal seed; induced crystallization; polycrystalline; rapid-melting-growth; size 5 mum; Epitaxial growth; Grain size; Microwave integrated circuits; Raman scattering; Silicon; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-5797-7
  • Type

    conf

  • DOI
    10.1109/ICSICT.2010.5667453
  • Filename
    5667453