DocumentCode
1631938
Title
Rapid-melting-growth of Ge on insulator using Cobalt (Co) induced-crystallized Ge as the seed for lateral growth
Author
Phung, Thanh Hoa ; Chen, Meijun ; Kang, Hong Joo ; Zhang, Chunfu ; Yu, Mingbin ; Zhu, Chunxiang
Author_Institution
Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
fYear
2010
Firstpage
1578
Lastpage
1580
Abstract
A new type of crystal seed, polycrystalline Ge (poly-Ge) formed by Co induced crystallization was used in the rapid-melting-growth (RMG) of Ge. With the poly-Ge seed, the grain size of Ge films obtained was significantly larger than the one using single crystal epitaxial Si as crystal seed and the one without any crystal seed. High quality (almost single crystal) Ge was obtained on 1 mm × 1 mm square structure and single crystal Ge was obtained on 5 μm wide Ge wires by the RMG method with Co-induced poly-Ge as the crystal seed.
Keywords
cobalt; crystallisation; germanium; silicon-on-insulator; Co; Ge on insulator; crystal seed; induced crystallization; polycrystalline; rapid-melting-growth; size 5 mum; Epitaxial growth; Grain size; Microwave integrated circuits; Raman scattering; Silicon; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
Conference_Location
Shanghai
Print_ISBN
978-1-4244-5797-7
Type
conf
DOI
10.1109/ICSICT.2010.5667453
Filename
5667453
Link To Document