DocumentCode
1632001
Title
Session Abstract
Author
Ivanov, Alexander
Author_Institution
University of British Columbia
fYear
2006
Firstpage
424
Lastpage
425
Abstract
Design technologies for silicon-based integrated systems present unprecedented advantages and challenges, the former being related to the very high device density and the latter the increased presence of defects. In 45nm CMOS, in a single system on chip (SoC) over a thousand microprocessor cores, or modules of comparable complexity, may be integrated. On the other hand using System-in-Package (SiP) technology separate chips can be packaged together into a system with a very small form factor using a common 2D or 3D substrate. It is most suitable for the integration of heterogeneous technologies where single-chip integration is difficult or too expensive to pursue.
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2006. Proceedings. 24th IEEE
Print_ISBN
0-7695-2514-8
Type
conf
DOI
10.1109/VTS.2006.71
Filename
1617629
Link To Document