• DocumentCode
    1632001
  • Title

    Session Abstract

  • Author

    Ivanov, Alexander

  • Author_Institution
    University of British Columbia
  • fYear
    2006
  • Firstpage
    424
  • Lastpage
    425
  • Abstract
    Design technologies for silicon-based integrated systems present unprecedented advantages and challenges, the former being related to the very high device density and the latter the increased presence of defects. In 45nm CMOS, in a single system on chip (SoC) over a thousand microprocessor cores, or modules of comparable complexity, may be integrated. On the other hand using System-in-Package (SiP) technology separate chips can be packaged together into a system with a very small form factor using a common 2D or 3D substrate. It is most suitable for the integration of heterogeneous technologies where single-chip integration is difficult or too expensive to pursue.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2006. Proceedings. 24th IEEE
  • Print_ISBN
    0-7695-2514-8
  • Type

    conf

  • DOI
    10.1109/VTS.2006.71
  • Filename
    1617629