DocumentCode :
1632001
Title :
Session Abstract
Author :
Ivanov, Alexander
Author_Institution :
University of British Columbia
fYear :
2006
Firstpage :
424
Lastpage :
425
Abstract :
Design technologies for silicon-based integrated systems present unprecedented advantages and challenges, the former being related to the very high device density and the latter the increased presence of defects. In 45nm CMOS, in a single system on chip (SoC) over a thousand microprocessor cores, or modules of comparable complexity, may be integrated. On the other hand using System-in-Package (SiP) technology separate chips can be packaged together into a system with a very small form factor using a common 2D or 3D substrate. It is most suitable for the integration of heterogeneous technologies where single-chip integration is difficult or too expensive to pursue.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2006. Proceedings. 24th IEEE
Print_ISBN :
0-7695-2514-8
Type :
conf
DOI :
10.1109/VTS.2006.71
Filename :
1617629
Link To Document :
بازگشت