Session Abstract

The role of ATE is changing from the traditional just go/no go classification to supporting yield learning and adaptive test methodologies as well. This new role demands additional functionalities (e.g. real-time test program control) from the tester as well as puts new requirements on the existing functionalities (e.g. throughput of error capture). This panel will discuss whether the existing ATE architectures are ready for these challenges and what changes need to be made if any to meet the requirements of new role.