DocumentCode :
1632132
Title :
Experimental study of a small gas-puff Z-pinch plasma device
Author :
Chengmu Luo ; Chengrong Li ; Xinxin Wang ; Zhifeng Xie ; Guo, X.M. ; Min Han
Author_Institution :
Dept. of Electr., Tsinghua Univ., Beijing, China
Volume :
2
fYear :
1999
Firstpage :
628
Abstract :
An experiment was carried out on a small gas-puff Z-pinch plasma device with capacitor bank of 16 /spl mu/F and charging voltage 22 kV. Discharge current was measured by Rogowski coil. A compact Thomson ion energy analyzer was installed in the discharge chamber for determining the energy spectra of ion beam emitted from the Z-pinch plasma. The energy spectra of argon ion beams with single, double and triple charges were determined using the analyzer. A Mach-Zehnder laser interferometer was installed to measure the electron density and the movement of Z-pinch plasma. The electron density of the plasma just before pinch instant is larger than 9.00/spl times/10/sup 18//cm/sup 3/, the corresponding radius and the pinch velocity of the plasma are 1.42 mm and 1.86 cm//spl mu/s, respectively. The yield and the time variation of X-ray emitted from the pinch plasma were also measured.
Keywords :
Mach-Zehnder interferometers; X-ray production; Z pinch; electric current measurement; electron density; ion beams; plasma devices; plasma diagnostics; 1.42 mm; 16 muF; 1860 cm/s; 22 kV; Mach-Zehnder laser interferometer; Rogowski coil; X-ray emission; Z-pinch plasma movement measurement; argon ion beams; capacitor bank; charging voltage; compact Thomson ion energy analyzer; discharge current measurement; electron density measurement; energy spectra; ion beam emission; plasma pinch velocity; small gas-puff Z-pinch plasma device; Capacitors; Coils; Current measurement; Electrons; Ion beams; Plasma density; Plasma devices; Plasma measurements; Plasma x-ray sources; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pulsed Power Conference, 1999. Digest of Technical Papers. 12th IEEE International
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7803-5498-2
Type :
conf
DOI :
10.1109/PPC.1999.823590
Filename :
823590
Link To Document :
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