DocumentCode

1632604

Title

A 30ns Faalt Tolerant 16k Cmos Eeprom

Author

Vancu, R. ; Ling Chen ; Smarandoiu, G.

Author_Institution

SEEQ Technology, Inc., San Jose, CA

fYear

1988

Firstpage

128

Keywords

Circuits; Current supplies; Dielectric devices; EPROM; Packaging; Pins; Time measurement; Tunneling; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Circuits Conference, 1988. Digest of Technical Papers. ISSCC. 1988 IEEE International

Conference_Location

San Francisco, CA, USA

Type

conf

DOI

10.1109/ISSCC.1988.663664

Filename

663664