Title :
A 30ns Faalt Tolerant 16k Cmos Eeprom
Author :
Vancu, R. ; Ling Chen ; Smarandoiu, G.
Author_Institution :
SEEQ Technology, Inc., San Jose, CA
Keywords :
Circuits; Current supplies; Dielectric devices; EPROM; Packaging; Pins; Time measurement; Tunneling; Voltage;
Conference_Titel :
Solid-State Circuits Conference, 1988. Digest of Technical Papers. ISSCC. 1988 IEEE International
Conference_Location :
San Francisco, CA, USA
DOI :
10.1109/ISSCC.1988.663664
