DocumentCode :
1632904
Title :
DC and analog/RF comparisons of Si- and Ge- nanowire schottky barrier transistors
Author :
Pu, Jing ; Sun, Lei ; Han, Ru-qi
Author_Institution :
Inst. of Microelectron., Peking Univ., Beijing, China
fYear :
2010
Firstpage :
947
Lastpage :
949
Abstract :
The DC and analog/RF performance of p-channel Schottky barrier Si and Ge nanowire transistors are simulated and some impact factors are studied. The results suggest that 100meV and 50meV are the most optimized Schottky barrier height for intrinsic gain and cutoff frequency respectively. Thinner nanowires enhance the drivability of silicon devices while impair that of germanium devices. With gate length scaled down, the intrinsic gain degrades, but cutoff frequency and intrinsic delay benefit from smaller capacitances.
Keywords :
Schottky barriers; elemental semiconductors; germanium; nanowires; silicon; DC-RF performance; Ge-nanowire Schottky barrier transistor; Schottky barrier height; Si-nanowire Schottky barrier transistor; analog-RF performance; p-channel Schottky barrier; silicon device; Delay; Logic gates; Schottky barriers; Silicon; Transistors; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-5797-7
Type :
conf
DOI :
10.1109/ICSICT.2010.5667493
Filename :
5667493
Link To Document :
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