Title :
The Influence of Human Contamination on Microelectronic Devices (IC´s) Reliability
Author :
Lion, Y. ; Brenman, M. ; Mejerovich, J.
Author_Institution :
Component Engineering, M.O.D., Haifa, Israel
Keywords :
Contamination; Corrosion; Humans; Metallization; Microelectronics; Production; Reliability engineering; Resistors; Testing; Very large scale integration;
Conference_Titel :
Electrical and Electronics Engineers in Israel, 1989. The Sixteenth Conference of
DOI :
10.1109/EEIS.1989.720135
