DocumentCode :
1633072
Title :
The Influence of Human Contamination on Microelectronic Devices (IC´s) Reliability
Author :
Lion, Y. ; Brenman, M. ; Mejerovich, J.
Author_Institution :
Component Engineering, M.O.D., Haifa, Israel
fYear :
1989
Firstpage :
1
Lastpage :
3
Keywords :
Contamination; Corrosion; Humans; Metallization; Microelectronics; Production; Reliability engineering; Resistors; Testing; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical and Electronics Engineers in Israel, 1989. The Sixteenth Conference of
Type :
conf
DOI :
10.1109/EEIS.1989.720135
Filename :
720135
Link To Document :
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