Design diversity redundancy with spatial-temporal voting applied to data acquisition systems

Due to the technology scaling of modern integrated circuits, the electronic systems are increasingly become more susceptible to transient faults, potentially caused by radiation interaction with the semiconductor. Furthermore the variability of production process, associated to this scaling, and the increase on the operating frequencies, lead to an increase on the probability of faults of complex circuits. This work addresses the concepts of redundancy and diversity with the DTMR technique to improve the fault tolerance of a data acquisition system. A physical implementation is made using a Programmable SoC from Cypress Semiconductor. Results indicate that the system is effective to tolerate single, double and multiple bit-flip faults.