Title :
Fault tolerant linear state machines
Author :
Weidling, S. ; Goessel, M.
Author_Institution :
Dept. of Comput. Sci., Univ. of Potsdam, Potsdam, Germany
Abstract :
In this paper, a new method for the design of fault-tolerant linear state machines with initial state 0 and one-dimensional input and one-dimensional output is proposed. It is shown that the LFSR-implementation of the transfer function of a linear automaton can be utilized to correct transient errors in the memory elements. Since the state vector of a linear automaton is uniquely determined by the last n inputs and outputs, a transient error in a memory element can be corrected within n clock cycles by use of the corrected output symbols, where n is the number of components of the state vector. Experimental results have shown that the lowest area overhead can be obtained if the linear state machine is duplicated and a single parity bit is used to distinguish which of the duplicated machines is correct. In this case, an area overhead of 177 % for an 8-bit state vector and 160% for a 256-bit state vector is achieved.
Keywords :
circuit reliability; error correction; fault tolerance; finite state machines; radiation hardening (electronics); transfer functions; 0 one-dimensional input; LFSR implementation; clock cycles; fault tolerant linear state machine; linear automaton; memory element; one-dimensional input; one-dimensional output; parity bit; state vector; transfer function; transient error correction; Automata; Fault tolerance; Fault tolerant systems; Logic gates; Multiplexing; Transient analysis; Vectors; fault tolerance; linear state machine; parity; transfer function; transient error;
Conference_Titel :
Test Workshop - LATW, 2014 15th Latin American
Conference_Location :
Fortaleza
DOI :
10.1109/LATW.2014.6841914