Title :
A 2.87±0.19dB NF 3.1∼10.6GHz ultra-wideband low-noise amplifier using 0.18µm CMOS technology
Author :
Wu, Chia-Hsing ; Lin, Yo-Sheng ; Lee, Jen-How ; Wang, Chien-Chin
Author_Institution :
Dept. of Electr. Eng., Nat. Chi Nan Univ., Puli, Taiwan
Abstract :
A 3.1~10.6 GHz ultra-wideband low-noise amplifier (UWB LNA) with excellent phase linearity property (group-delay variation is only ±15.8 ps across the whole band) using standard 0.18 μm CMOS technology is reported. Both high and flat power gain (S21) and low and flat noise figure (NF) frequency responses are achieved by tuning the pole frequencies and pole quality factors of the second-order gain and NF frequency responses to approximate the maximally flat condition simultaneously. The LNA dissipates 11.8 mW power and achieves input return loss (S11) smaller than -10.2 dB, high and flat S21 of 12.52±0.81 dB, and low and flat NF of 2.87±0.19 dB over the 3.1~10.6 GHz band. To the author´s knowledge, this is one of the lowest NFs ever reported for a 3.1~10.6 GHz UWB CMOS LNA. The measured 1-dB compression point (P1dB) and input third-order inter-modulation point (IIP3) are -16 dBm and -6.5 dBm, respectively, at 6 GHz.
Keywords :
CMOS analogue integrated circuits; MMIC amplifiers; frequency response; low noise amplifiers; wideband amplifiers; UWB LNA; flat NF frequency response; flat noise figure frequency response; flat power gain; frequency 3.1 GHz to 10.6 GHz; group-delay variation; high power gain; input return loss; low NF frequency response; low noise figure frequency response; noise figure 1 dB; phase linearity property; pole frequencies tuning; power 11.8 mW; power dissipation; second-order gain pole quality factor; size 0.18 mum; standard CMOS technology; time -15.8 ps; time 15.8 ps; ultrawideband low-noise amplifier; CMOS integrated circuits; CMOS technology; Frequency measurement; Gain; Impedance matching; Noise measurement; Wideband; CMOS; gain; group delay; low noise amplifier (LNA); low power; noise figure; ultra-wideband (UWB);
Conference_Titel :
Radio and Wireless Symposium (RWS), 2012 IEEE
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4577-1153-4
DOI :
10.1109/RWS.2012.6175315