Title :
Long-term stability (aging) of evacuated hybrid OCXO
Author :
Abramzon, Igor ; Boroditsky, Roman
Author_Institution :
VF Technol., Hopkinton, MA, USA
fDate :
6/23/1905 12:00:00 AM
Abstract :
The work is devoted to research in frequency stability of miniature integrated OCXO packaged in TO-8 vacuum holder. Since a number of electronic components and materials are involved in the unit design such investigations are of primary interest. The paper describes results of a long-term stability (aging) test of the OCXO during the period of about 2 years. Besides aging, various experiments including retrace and frequency hysteresis measurements are described. Experiments proved that the hybrid technology is suitable for fabrication of high stability miniature OCXO
Keywords :
ageing; crystal resonators; electron device manufacture; electron device testing; frequency stability; 2 year; TO-8 vacuum holder; aging test; evacuated frequency stability; fabrication; frequency hysteresis; long-term stability; miniature integrated OCXO; retrace; Aging; Circuits; DH-HEMTs; Energy consumption; Fabrication; Frequency; Packaging; Stability; Testing; Vacuum technology;
Conference_Titel :
Frequency Control Symposium and PDA Exhibition, 2001. Proceedings of the 2001 IEEE International
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-7028-7
DOI :
10.1109/FREQ.2001.956381
