Title :
Eigenface classification using an extended kernel-based nonlinear discriminator
Author :
Liu, Benyong ; Liu, Bing ; Sun, Xin ; Zhang, Jing
Author_Institution :
Coll. of Electron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Abstract :
This paper extends a kernel-based nonlinear discriminator (KND) to a new version by an oblique projection realization and applies it to eigenface classification. In an extended KND, the effect of the target class on the performance of a classifier is considered. Experimental results on the ORL face database demonstrate the effectiveness of an eKND in face recognition.
Keywords :
eigenvalues and eigenfunctions; face recognition; feature extraction; image classification; ORL face database; eigenface classification; extended KND; extended kernel-based nonlinear discriminator; face recognition; oblique projection; performance; Cost function; Educational institutions; Face recognition; Feature extraction; Kernel; Linear discriminant analysis; Principal component analysis; Sun; Support vector machine classification; Support vector machines;
Conference_Titel :
Communications, Circuits and Systems, 2004. ICCCAS 2004. 2004 International Conference on
Print_ISBN :
0-7803-8647-7
DOI :
10.1109/ICCCAS.2004.1346373
