DocumentCode :
1634175
Title :
Spectroscopic investigations of the magnetic field and electron density evolution in a microsecond POS [pulsed power switches]
Author :
Arad, R. ; Tsigutkin, K. ; Fruchtman, A. ; Maron, Y.
Author_Institution :
Fac. of Phys., Weizmann Inst. of Sci., Rehovot, Israel
Volume :
2
fYear :
1999
Firstpage :
925
Abstract :
Spatially resolved measurements in a planar microsecond POS using spectroscopy of dopants in the plasma are presented. The initial plasma properties such as the electron density and temperature and the plasma composition are determined. The magnetic field evolution determined from Zeeman splitting is mapped in 2D and found to propagate axially in the form of a broad current channel, at an average velocity of 3.3/spl times/10/sup 7/ cm/s. Observations of different spectral line intensities and collisional-radiative modelings are used to show that the mean electron energy rises to at least 50 eV during the conduction phase and the electron energy distribution is shown to be nonMaxwellian. The electron density determined from the temporal behavior of various spectral lines is found to drop after the magnetic field reaches 50% of its peak value.
Keywords :
electron density; magnetic fields; plasma diagnostics; plasma switches; pulsed power switches; spectroscopy; switchgear testing; 2D mapping; 3.3E7 cm/s; 50 eV; Zeeman splitting; axial propagation; broad current channel; collisional-radiative model; conduction phase; dopant spectroscopy; electron density; electron temperature; magnetic field; mean electron energy; microsecond plasma opening switch; nonMaxwellian electron energy distribution; pulsed power switch; spatially resolved measurements; spectral line intensities; temporal behavior; Electrons; Magnetic field measurement; Magnetic fields; Plasma accelerators; Plasma density; Plasma measurements; Plasma sources; Spatial resolution; Spectroscopy; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pulsed Power Conference, 1999. Digest of Technical Papers. 12th IEEE International
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7803-5498-2
Type :
conf
DOI :
10.1109/PPC.1999.823667
Filename :
823667
Link To Document :
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