• DocumentCode
    1634384
  • Title

    Differential RCS and sensitivity calculation of RFID tags with Software-Defined Radio

  • Author

    De Donno, Danilo ; Catarinucci, Luca ; Colella, Riccardo ; Ricciato, Fabio ; Tarricone, Luciano

  • Author_Institution
    Innovation Eng. Dept., Univ. of Salento, Lecce, Italy
  • fYear
    2012
  • Firstpage
    9
  • Lastpage
    12
  • Abstract
    Performance evaluation of passive Radio Frequency IDentification (RFID) tags is a challenging task. In fact, tag performance depends on multiple factors such as the goodness of the conjugate matching between chip and antenna, the chip sensitivity, the strength and quality of the backscattered signal. Commercially available solutions for tag testing are very expensive and not totally flexible. In this work, we propose a novel approach for precise characterization of RFID tags based on Software-Defined Radio (SDR). We show how a cheap (below 1000$) and flexible SDR-based RFID reader can be turned into an accurate tool for measuring the tag sensitivity and differential radar cross-section. We test our platform by analyzing the performance of two built-in-lab tags: measurements show a strong agreement with theoretical and simulation results.
  • Keywords
    UHF measurement; antennas; backscatter; performance evaluation; radar cross-sections; radiofrequency identification; sensitivity analysis; software radio; test equipment; RFID tags; antenna; backscattered signal quality; built-in-lab tag; chip sensitivity; conjugate matching; differential RCS; differential radar cross-section; flexible SDR-based RFID reader; passive radiofrequency identification tags; sensitivity calculation; software-defined radio; tag performance evaluation; tag sensitivity measurement; tag testing; Antenna measurements; Antennas; Passive RFID tags; Protocols; Sensitivity; Software radio; GNU-Radio; RFID; Software-Defined Radio; measurements; passive; performance; tag;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio and Wireless Symposium (RWS), 2012 IEEE
  • Conference_Location
    Santa Clara, CA
  • ISSN
    2164-2958
  • Print_ISBN
    978-1-4577-1153-4
  • Type

    conf

  • DOI
    10.1109/RWS.2012.6175347
  • Filename
    6175347