• DocumentCode
    163453
  • Title

    Measuring the Magnitude of Envelope Fluctuations: Should We Use the PAPR?

  • Author

    Bento, Pedro ; Nunes, J. ; Gomes, Marcio ; Dinis, Rui ; Silva, Valter

  • Author_Institution
    Inst. de Telecomun. (IT), Portugal
  • fYear
    2014
  • fDate
    14-17 Sept. 2014
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    The PAPR (Peak-to-Average Power Ratio) is widely employed to measure the magnitude of the envelope fluctuations of a given signal. It is particularly used to define the required amplifier back- off for multi-carrier modulations such as OFDM (Orthogonal Frequency Division Multiplexing) schemes. However, the PAPR increases with the block size (i.e., the number of subcarriers, in the OFDM case), but the signal´s distribution converges to a Gaussian distribution for a large number of subcarriers. Therefore, one might ask if the PAPR is indeed the best parameter to define the amplifier´s back-off. In this paper we address this issue. It is shown that the required amplifier´s back-off for a given non-linear distortion level, i.e. referred to the input amplifier saturation power, is almost independent of the number of subcarriers and, therefore, the PAPR is not the most suitable to define it. Therefore, we recommend the use of a parameter related to the instantaneous envelope power distribution to define the amplifier back-off.
  • Keywords
    Gaussian distribution; OFDM modulation; nonlinear distortion; Gaussian distribution; OFDM scheme; PAPR; amplifier back-off; block size; envelope fluctuation magnitude measurement; input amplifier saturation power; instantaneous envelope power distribution; multicarrier modulation; nonlinear distortion level; orthogonal frequency division multiplexing scheme; peak-to-average power ratio; signal distribution; subcarrier number; Modulation; Nonlinear distortion; Peak to average power ratio; Power measurement; Wireless communication;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vehicular Technology Conference (VTC Fall), 2014 IEEE 80th
  • Conference_Location
    Vancouver, BC
  • Type

    conf

  • DOI
    10.1109/VTCFall.2014.6966053
  • Filename
    6966053