Title :
Channel Estimation for OFDM Systems in the Presence of Carrier Frequency Offset and Phase Noise
Author :
Tao, Jun ; Wu, Jingxian ; Xiao, Chengshan
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Missouri-Columbia, Columbia, MO
Abstract :
Channel estimation for orthogonal frequency division multiplexing (OFDM) system at the presence of carrier frequency offset (CFO) and phase noise is discussed in this paper. A CFO estimation algorithm is developed by exploiting the time-frequency structure of training symbols, and it provides a very accurate estimation of CFO at the presence of both unknown frequency selective fading and phase noise. Based on the estimated CFO, the phase noise and frequency selective fading are jointly estimated by employing the maximum a posteriori (MAP) criterion. Specifically, the fading channel is estimated in the form of frequency domain channel transfer function (CTF). The estimation of CTF eliminates the requirement of the priori knowledge of channel length, and it is simpler compared to the time domain channel impulse response (CIR) estimation method in the literature. Theoretical analysis with Cramer-Rao lower bound demonstrates that the joint phase noise and CTF estimation can achieve near optimum performance.
Keywords :
OFDM modulation; channel estimation; fading channels; frequency-domain analysis; maximum likelihood estimation; phase noise; time-domain analysis; transfer functions; transient response; Cramer-Rao lower bound; OFDM systems; carrier frequency offset; channel estimation; frequency domain channel transfer function; frequency selective fading channel; maximum a posteriori criterion; orthogonal frequency division multiplexing system; phase noise; time domain channel impulse response estimation method; time-frequency structure; training symbols; Channel estimation; Fading; Frequency domain analysis; Frequency estimation; OFDM; Performance analysis; Phase estimation; Phase noise; Time frequency analysis; Transfer functions;
Conference_Titel :
Communications, 2008. ICC '08. IEEE International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-2075-9
Electronic_ISBN :
978-1-4244-2075-9
DOI :
10.1109/ICC.2008.952