DocumentCode
1635062
Title
Radiation experiments on the Z-machine
Author
Idzorek, G.C. ; Chrien, R.E. ; Matuska, W. ; Peterson, D.L. ; Swenson, F.J. ; Chandler, G.A. ; Porter, J.L. ; Ruggles, L.E.
Author_Institution
Los Alamos Nat. Lab., NM, USA
Volume
2
fYear
1999
Firstpage
1060
Abstract
High temperatures generated from imploding wires arrays on the Sandia National Laboratories Z-machine produce a radiation source with a bolometric temperature of several hundred eV. By surrounding the Z-pinch implosion with a hohlraum a nearly Planckian source of about 140 eV peak temperature and 10 ns width is created. However the high temperature peak is preceded by a lower temperature foot of about 30 eV temperature lasting almost 100 ns. To prevent experiments from being destroyed by the pre-pulse a thin plastic burn-through foil is placed between the hohlraum and the experiment. The foil thickness and composition are chosen to ionize and become transparent at the time the high temperature pulse occurs. Also at these temperatures diagnostic holes in the hohlraum wall vaporize and material jets into the hole reducing the effective hole size. We present a series of Z-machine experiments which characterized and modified the raw radiation source into a suitable driver for radiation flow experiments.
Keywords
X-ray production; Z pinch; collective accelerators; exploding wires; ion accelerators; pulsed power supplies; Sandia National Laboratories Z-machine; X-ray source; Z accelerator; Z-machine; Z-pinch implosion; bolometric temperature; diagnostic holes; foil composition; foil thickness; high temperature peak; high temperature pulse; high temperatures; hohlraum; imploding wires arrays; ionization; nearly Planckian source; radiation experiments; radiation flow experiments; radiation source; thin plastic burn-through foil; Contracts; Foot; Gold; Laboratories; Plasma temperature; Plastics; Signal detection; Wire; X-ray detection; X-ray detectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Pulsed Power Conference, 1999. Digest of Technical Papers. 12th IEEE International
Conference_Location
Monterey, CA, USA
Print_ISBN
0-7803-5498-2
Type
conf
DOI
10.1109/PPC.1999.823702
Filename
823702
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