Title :
A novel method for measuring dielectric surface charge density by means of Pockels effect and optical phase compensation
Author :
Ping, Zhang ; Kaixi, Zhang
Author_Institution :
Dept. of Phys., Hebei Univ., Baoding, China
Abstract :
A new method for measuring surface charge density by means of the Pockels effect and optical phase compensation is presented. Totally different from current measuring methods, the probe of this new measuring device is made of a Pockels crystal and the principle of the measurement is based on optical phase compensation. This probe brings much less disturbance to the surface charge density, especially, one on a conductor surface and the measurement result is easily obtained by readings of a voltmeter
Keywords :
Pockels effect; charge measurement; compensation; dielectric measurement; surface charging; Pockels effect; conductor surface; dielectric surface charge density measurement; optical phase compensation; probe; voltmeter; Birefringence; Density measurement; Dielectric measurements; Equations; Optical polarization; Optical propagation; Optical refraction; Optical surface waves; Optical variables control; Refractive index;
Conference_Titel :
Properties and Applications of Dielectric Materials, 1997., Proceedings of the 5th International Conference on
Conference_Location :
Seoul
Print_ISBN :
0-7803-2651-2
DOI :
10.1109/ICPADM.1997.617538
