Title :
AL/RTL co-modeling and general test generation
Author :
Wu, Weimin ; Zhu, Ming ; Zhao, Jianzhou ; Bian, Jinian
Author_Institution :
Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing, China
Abstract :
Current hardware/software co-design and SOC design often need to handle system descriptions at different abstraction levels. This requires a unified modeling method across the levels to facilitate design validation. This paper addresses the problem of co-modeling across algorithmic level (AL) and register transfer level (RTL). A constraint satisfaction problem (CSP) is utilized to do the modeling. We give a framework on how to do general test generation based on this co-modeling technique with a constraint logic programming (CLP) tool as the problem-solving engine. By experimenting on an example we built, we demonstrate the application of co-modeling method.
Keywords :
VLSI; constraint handling; electronic design automation; formal verification; hardware-software codesign; integrated circuit testing; system-on-chip; AL/RTL co-modeling; CLP tool; CSP; SOC design; algorithmic level; constraint logic programming; constraint satisfaction problem; design validation; general test generation; hardware/software co-design; register transfer level; unified modeling method; Automatic test pattern generation; Circuit faults; Computer science; Digital systems; Engines; Hardware design languages; Logic programming; Logic testing; Problem-solving; Software testing;
Conference_Titel :
Communications, Circuits and Systems, 2004. ICCCAS 2004. 2004 International Conference on
Print_ISBN :
0-7803-8647-7
DOI :
10.1109/ICCCAS.2004.1346417