DocumentCode :
1635349
Title :
Novel polymer resistive memory based on parylene with high compatibility and scalability
Author :
Tang, Yu ; Kuang, Yongbian ; Ding, Wei ; Zhang, Lijie ; Tang, Poren ; Qin, Shiqiang ; Wang, Yangyuan ; Huang, Ru
Author_Institution :
Inst. of Microelectron., Peking Univ., Beijing, China
fYear :
2010
Firstpage :
1166
Lastpage :
1168
Abstract :
A novel polymer (organic) resistive memory device with the structure of W/parylene+Au/Al is presented in this paper. The organic memory device exhibits not only high scalability but also good compatibility with CMOS back-end process, for parylene is immune to the lithographic solvents. Moreover, parylene film could be fabricated by chemical vapor deposition (CVD) instead of spin-coating, thus the quality and uniformity of the film can be improved. The device exhibits good nonvolatile memory characteristics, including low operating voltage (1.5 V / -3 V) and good retention capability (29000 s). A possible switching mechanism is also proposed and supported by the experimental data. The device shows great potentials for flexible, stackable and high-density memory applications.
Keywords :
aluminium; chemical vapour deposition; gold; polymers; random-access storage; tungsten; CMOS back-end process; CVD; chemical vapor deposition; lithographic solvent; nonvolatile memory characteristic; organic memory device; parylene; polymer resistive memory; switching mechanism; voltage 1.5 V to -3 V; Electrodes; Fabrication; Films; Gold; Nonvolatile memory; Polymers; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-5797-7
Type :
conf
DOI :
10.1109/ICSICT.2010.5667590
Filename :
5667590
Link To Document :
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