A high performance, 10-volt integrated pin electronics driver

Author

Branson, Chris

Author_Institution

Tektronix Inc., Beaverton, OR, USA

fYear

1989

Firstpage

846

Lastpage

853

Abstract

A high-voltage process module is added to a standard 1.5-μm digital CMOS process, allowing a 10-volt pin electronics driver to be integrated onto the same silicon with its timing and formatting circuitry. A single analog output driver circuit provides fast rise time, low-distortion output waveforms for both narrow and wide voltage swings, eliminating the need for dual drivers or testheads when testing mixed technology devices or modules. Novel design and calibration techniques are used to overcome the limitations of the high-voltage CMOS process. The driver IC is used in production VLSI test systems and is capable of outputting data rates up to 200 Mb/s with a maximum driver output swing of 10 volts

Keywords

CMOS integrated circuits; VLSI; driver circuits; integrated circuit technology; integrated circuit testing; 1.5 micron; 10 V; 200 Mbit/s; Si; VLSI test systems; analog output driver; calibration; design; digital CMOS; driver IC; high-voltage CMOS; integrated pin electronics driver; mixed technology devices testing; module; CMOS process; CMOS technology; Calibration; Circuit testing; Driver circuits; Integrated circuit technology; Production systems; Silicon; Timing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1989. Proceedings. Meeting the Tests of Time., International

Conference_Location

Washington, DC

Type

conf

DOI

10.1109/TEST.1989.82374

Filename

82374