DocumentCode :
1636106
Title :
The effect of isotropic and anisotropic scattering in drain region of ballistic channel diode
Author :
Abudukelimu, A. ; Kakushima, K. ; Ahmet, P. ; Geni, M. ; Tsutsui, K. ; Nishiyama, A. ; Sugii, N. ; Natori, K. ; Hattori, T. ; Iwai, H.
Author_Institution :
Frontier Res. Center, Tokyo Inst. of Technol., Yokohama, Japan
fYear :
2010
Firstpage :
1247
Lastpage :
1249
Abstract :
The effect of isotropic and anisotropic scattering within the drain region of diode with ballistic channel is investigated using the semiclassical Monte Carlo simulation, and the results are discussed. The results show that the isotropic scattering can severely degrade the steady-state current, the electrons mean velocity, and increase the electrons concentration in channel because some hot electrons can back into the channel from drain, and even return to the source. On the contrary, anisotropic scattering can suppresses the backward flow of hot electrons. We conclude that the isotropic scattering in the drain region seriously influences the carrier transport relative to anisotropic scattering.
Keywords :
Monte Carlo methods; ballistic transport; carrier mobility; hot carriers; scattering; semiconductor diodes; anisotropic scattering; ballistic channel diode; carrier transport; drain region; electron concentration; electron mean velocity; hot electron; isotropic scattering; semiclassical Monte Carlo simulation; steady-state current; Acoustics; Impurities; Nanoscale devices; Phonons; Scattering; Semiconductor diodes; Steady-state;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-5797-7
Type :
conf
DOI :
10.1109/ICSICT.2010.5667622
Filename :
5667622
Link To Document :
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