DocumentCode
1636106
Title
The effect of isotropic and anisotropic scattering in drain region of ballistic channel diode
Author
Abudukelimu, A. ; Kakushima, K. ; Ahmet, P. ; Geni, M. ; Tsutsui, K. ; Nishiyama, A. ; Sugii, N. ; Natori, K. ; Hattori, T. ; Iwai, H.
Author_Institution
Frontier Res. Center, Tokyo Inst. of Technol., Yokohama, Japan
fYear
2010
Firstpage
1247
Lastpage
1249
Abstract
The effect of isotropic and anisotropic scattering within the drain region of diode with ballistic channel is investigated using the semiclassical Monte Carlo simulation, and the results are discussed. The results show that the isotropic scattering can severely degrade the steady-state current, the electrons mean velocity, and increase the electrons concentration in channel because some hot electrons can back into the channel from drain, and even return to the source. On the contrary, anisotropic scattering can suppresses the backward flow of hot electrons. We conclude that the isotropic scattering in the drain region seriously influences the carrier transport relative to anisotropic scattering.
Keywords
Monte Carlo methods; ballistic transport; carrier mobility; hot carriers; scattering; semiconductor diodes; anisotropic scattering; ballistic channel diode; carrier transport; drain region; electron concentration; electron mean velocity; hot electron; isotropic scattering; semiclassical Monte Carlo simulation; steady-state current; Acoustics; Impurities; Nanoscale devices; Phonons; Scattering; Semiconductor diodes; Steady-state;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on
Conference_Location
Shanghai
Print_ISBN
978-1-4244-5797-7
Type
conf
DOI
10.1109/ICSICT.2010.5667622
Filename
5667622
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